|By Business Wire||
|April 28, 2014 01:31 PM EDT||
Research and Markets (http://www.researchandmarkets.com/research/8rhswr/global_thin_film) has announced the addition of the "Global Thin Film Metrology Systems Market Forecasts & Opportunities, 2018" report to their offering.
One of the key factors contributing to this market growth is the high demand for thin film metrology systems for the development of flat panel displays. The Global Thin Film Metrology Systems market has also been witnessing the increased R&D spending by vendors. However, the cyclical nature of the semiconductor industry could pose a challenge to the growth of this market.
According to the report, the high demand for thin film metrology systems for the development of flat panel displays is an important driver. These systems are used for measuring the thin films used in the flat panel displays of portable mobile devices such as smartphones, tablets, and e-readers.
Further, the report states that one of the key challenges in this market is the cyclical nature of the Semiconductor industry. The Semiconductor industry is one of the major end-users of thin film metrology systems, and any fluctuations in this industry inevitably leads to fluctuations in the Global Thin Film Metrology Systems market.
Key vendors dominating this space include:
- Nanometrics Inc
- Nova Measuring Instruments
- KLA-Tencor Corp.
- Rudolph Technologies Inc.
Key Topics Covered:
- Executive Summary
- List of Abbreviations
- Scope of the Report
- Market Research Methodology
- Market Landscape
- Geographical Segmentation
- Key Leading Countries
- Buying Criteria
- Market Growth Drivers
- Drivers and their Impact
- Market Challenges
- Impact of Drivers and Challenges
- Market Trends
- Trends and their Impact
- Vendor Landscape
- Key Vendor Analysis
For more information visit http://www.researchandmarkets.com/research/8rhswr/global_thin_film
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